Since 2020, aggregated from related topics
Transmission electron microscopy (TEM) is a powerful technique used to study the structure and properties of materials at the nanoscale. In TEM, a beam of electrons is transmitted through the sample, allowing for high-resolution imaging and analysis of the sample's internal structure. This technique is commonly used in materials science, biology, and chemistry to investigate the atomic structure, crystalline structure, and composition of materials. TEM can also be used to study the morphology of nanoparticles, defects in materials, and the interface between different materials. Overall, transmission electron microscopy provides detailed and valuable information about the microstructure of materials at the atomic level.